Exploring nanoscale electrical and dielectric phenomena with scanning microwave impedance microscopy
2027 TechConnect World Innovation Conference and Expo
Exploring nanoscale electrical and dielectric phenomena with scanning microwave impedance microscopy was a session at 2027 TechConnect World Innovation Conference and Expo in Boston, with 1 speaker on record.
Speakers
- Sabine Neumayer — Speaker R&D Staff Scientist, Oak Ridge National Laboratory